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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11313820 B1

PDFFull Text
Date of Patent:
Apr. 26, 2022

Filed:

Jun. 10, 2019

Methods and systems for determining an internal property of a food product

Applicant:

Walmart Apollo, Llc, Bentonville, AR (US);

Inventors:

Steven Lewis, Bentonville, AR (US);

Matthew Biermann, Fayetteville, AR (US);

Suman Pattnaik, Bentonville, AR (US);

Assignee:

Walmart Apollo, LLC, Bentonville, AR (US);

Attorneys:

Duane Morris LLP

Manita Rawat

Primary Examiner:

Huy Q Phan

Assistant Examiner:

David B Frederiksen

Int. Cl.
CPC ...
G01N 27/02 (2006.01); G01R 27/16 (2006.01); G01N 33/12 (2006.01);
U.S. Cl.
CPC ...
G01N 27/02 (2013.01); G01N 33/12 (2013.01); G01R 27/16 (2013.01);
Abstract

Systems and methods are provided to determine an internal property of a food product. The system includes one or more analyzing devices, a camera and a central unit in communication with the camera and analyzing device. The analyzing device is configured to analyze an interior region of the food product. The camera is configured to analyze an external property of the food product. The central unit is configured to determine the internal property of the food product based on feedback provided by the analyzing device and the camera.

Find Patent Forward Citations

Lewis, Steven. (2022). Methods and systems for determining an internal property of a food product (U.S. Patent No. 11313820). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11313820

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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