The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 2022

Filed:

Sep. 24, 2019
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Kohei Ota, Kanagawa, JP;

Takuji Tada, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6486 (2013.01); G01N 2201/022 (2013.01); G01N 2201/023 (2013.01); G01N 2201/08 (2013.01);
Abstract

The sample imaging apparatus includes: a housing that forms a closed space; a transparent tray on which a sample is placed in the housing; a plane light source that is formed by using a flat light guide plate, which propagates light emitted by a light emitting element in a plane direction, so as to illuminates the sample with illumination light through the tray in the housing; a lens that is disposed in the housing so as to face the plane light source with the tray interposed between the lens and the plane light source and is used for imaging the sample; and an imaging control unit that adjusts a focal length of the lens and performs imaging in a case of imaging the single sample.


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