The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 2022

Filed:

Jul. 20, 2020
Applicant:

Zyvex Labs, Llc, Richardson, TX (US);

Inventors:

Gerhard Maale, Dallas, TX (US);

Rahul Saini, Allen, TX (US);

John Neal Randall, Richardson, TX (US);

Assignee:

ZYVEX LABS, LLC, Richardson, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/21 (2006.01); G01N 21/47 (2006.01); G01N 33/52 (2006.01); G01N 33/543 (2006.01); C12Q 1/68 (2018.01); G01N 21/45 (2006.01); G01N 27/327 (2006.01);
U.S. Cl.
CPC ...
G01N 21/211 (2013.01); G01N 21/47 (2013.01); G01N 33/525 (2013.01); G01N 33/54306 (2013.01); C12Q 1/68 (2013.01); G01N 21/45 (2013.01); G01N 27/3275 (2013.01); G01N 33/54373 (2013.01);
Abstract

A sensor suitable for detecting specific analytes, a method for manufacturing the sensor, and a method for using the sensor in a diagnostic procedure provided. In an embodiment, the sensor device includes a substrate, a dielectric layer disposed on the substrate, and a probe layer disposed on the dielectric layer. The probe layer is configured to react with an analyte. The reaction may include: binding with the analyte, undergoing a change in a chemical property of the probe layer, or undergoing a change in a structural property of the probe layer. In examples, an attribute of the dielectric layer is configured to identify the device during a process that determines whether the probe layer has reacted with the analyte.


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