The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2022
Filed:
Feb. 04, 2020
Aptiv Technologies Limited, St. Michael, BB;
James C. Baar, Logansport, IN (US);
Steven D. Kaufman, Cicero, IN (US);
Timothy D. Garner, Cicero, IN (US);
Robert R. Bugher, Russiaville, IN (US);
Raul Alfonso Zubia Duran, Kokomo, IN (US);
Benjamin Dilsaver, Kokomo, IN (US);
Az Eddine Farouki, Kokomo, IN (US);
APTIV TECHNOLOGIES LIMITED, St. Michael, BB;
Abstract
A detector testing system includes an environmental chamber configured to provide at least one selected environmental condition within the chamber. The environmental chamber includes an opening. A cover over the opening has at least one surface that is at least partially transparent to radiation that the detector is configured to receive. The cover is configured to maintain the at least one selected environmental condition within the environmental chamber. A detector support is configured to support a plurality of detectors exposed to the at least one selected environmental condition in a location within a space defined by the cover where the cover provides a detector field of view through the at least one surface. The detector field of view for each of the detectors has a horizontal range of at least 180°.