The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2022
Filed:
Jul. 11, 2019
Adolphe Merkle Institute, University of Fribourg, Fribourg, CH;
Sandor Balog, Fribourg, CH;
ADOLPHE MERKLE INSTITUTE, UNIVERSITY OF FRIBOURG, Fribourg, CH;
Abstract
Methods of analyzing and filtering light scattering data from a sample potentially containing a non-target compound, for example a contaminant. The presence of contaminants result in outliers in the scattering intensity data that increase both symmetry and width of photon counts obtained via analysis. After identification, various outliers are discarded to account for the non-target compounds and thereafter the remaining light scattering data is analyzed. Preferably, analyzing the light scattering data or photon counts involves determining a level to discard an outlier. In particular, the method includes the steps of identifying and quantifying the mode of photon count distribution and using the peak of the mode of distribution to eliminate outliers.