The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 2022

Filed:

Aug. 22, 2019
Applicant:

Government of the United States, As Represented BY the Secretary of the Air Force, Wright-Patterson AFB, OH (US);

Inventors:

Jonathan E. Spowart, Beavercreek, OH (US);

Colin Rowbottom, Englewood, FL (US);

Carly S. Hauser, Ripley, OH (US);

Eric A. Lindgren, Beavercreek, OH (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 11/00 (2006.01); G01N 11/16 (2006.01); G01N 11/14 (2006.01);
U.S. Cl.
CPC ...
G01N 11/00 (2013.01); G01N 11/16 (2013.01); G01N 2011/002 (2013.01); G01N 2011/006 (2013.01); G01N 2011/147 (2013.01); G01N 2203/0094 (2013.01);
Abstract

The present invention relates to devices for measuring property changes via in-situ micro-viscometry and methods of using same. The aforementioned device is inexpensive and can be used to quickly and accurately measure numerous physical and chemical property changes, including but not limited to the rate of chemical cure, change in tack, and rate of mass loss, for example, rate of moisture, solvent and/or plasticizer change.


Find Patent Forward Citations

Loading…