The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2022
Filed:
Jan. 31, 2019
Omron Corporation, Kyoto, JP;
Xingdou Fu, Kizugawa, JP;
Takashi Shimizu, Hikone, JP;
OMRON Corporation, Kyoto, JP;
Abstract
The three-dimensional measurement apparatus includes a projecting unit configured to project patterned light onto a measurement target and an image capturing unit configured to capture an image of the measurement target onto which the patterned light is projected, with a predetermined exposure time, a calculation unit configured to calculate positions of a three-dimensional point group expressing a three-dimensional shape of the measurement target based on the feature points included in the image, and a determination unit configured to determine the exposure time such that at least one of the number of feature points and the number of three-dimensional point groups is equal to or greater than a threshold that is defined based on one of their maximum numbers, and the exposure time is shorter than an exposure time for the maximum number.