The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2022
Filed:
Apr. 06, 2021
East China Normal University, Shanghai, CN;
Shi'an Zhang, Shanghai, CN;
Dalong Qi, Shanghai, CN;
Chengzhi Jin, Shanghai, CN;
Yilin He, Shanghai, CN;
Chengshuai Yang, Shanghai, CN;
Fengyan Cao, Shanghai, CN;
Yunhua Yao, Shanghai, CN;
Yan Yang, Shanghai, CN;
Zhenrong Sun, Shanghai, CN;
East China Normal University, Shanghai, CN;
Abstract
The present disclosure provides a compressed ultrafast imaging velocity interferometer system for any reflector, comprising a light source and target system, an etalon interference system, a compressed ultrafast imaging system, a timing control system and a data processing system. An imaging device in the traditional imaging velocity interferometer system for any reflector is replaced by a compressed ultrafast imaging system, a compressed ultrafast Photography (CUP) is introduced in an imaging process, multi-frame images, i.e. three-dimensional images for two-dimensional space and one-dimensional time, are reconstructed via a single measurement by a CUP-VISAR two-dimensional ultrafast dynamic image imaging, a complete dynamic process of a two-dimensional interference fringes image is restored, and spatiotemporal evolution information of a shock wave is effectively acquired, improving an imaging performance of the imaging velocity interferometer system for any reflector in dimension, and achieving a goal that could not be achieved before.