The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2022
Filed:
Aug. 07, 2020
Lighton Sas, Paris, FR;
Kilian Müller, Paris, FR;
Laurent Daudet, Paris, FR;
Igor Carron, Paris, FR;
Gustave Pariente, Paris, FR;
LightOn SAS, Paris, FR;
Abstract
The present description relates to a stabilized interferometric system comprising: a light source () for emitting an initial beam of coherent light; a spatial light modulator () configured to receive at least a first part of said initial beam and input data () and configured to emit a spatially modulated beam resulting from a spatial modulation of a parameter of said first part of said initial beam based on said input data; a scattering medium () configured to receive said spatially modulated beam; a detection unit () configured to acquire an interference pattern (IN) resulting from the interferences between randomly scattered optical paths taken by the spatially modulated beam through the scattering material; a control unit () configured to vary the frequency of the laser source in order to at least partially compensate a change in said interference pattern resulting from a change in at least one environmental parameter.