The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 2022

Filed:

Dec. 26, 2017
Applicant:

Nihon Kohden Corporation, Tokorozawa, JP;

Inventors:

Hodaka Makino, Tokorozawa, JP;

Wataru Matsuzawa, Tokorozawa, JP;

Assignee:

Nihon Kohden Corporation, Tokorozawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12M 1/34 (2006.01); C12M 1/36 (2006.01); C12M 1/26 (2006.01); C12M 1/00 (2006.01);
U.S. Cl.
CPC ...
C12M 41/00 (2013.01); C12M 33/00 (2013.01); C12M 41/12 (2013.01); C12M 41/14 (2013.01); C12M 41/26 (2013.01); C12M 41/34 (2013.01); C12M 41/36 (2013.01); C12M 41/48 (2013.01);
Abstract

An object of the present disclosure is to provide a cell culture system, a cell culture environment evaluation device, and a program, capable of performing evaluation of a culture environment without causing an adverse effect on cell culture. An isolator is provided with a culture environment for housing a cell culture vessel having a culture solution containing cells to be cultured placed therein. A sensing unit measures the state of the culture environment and transmits the measurement result of the culture environment to the outside of the isolator. A control device receives the measurement result and performs evaluation in the culture environment based on the measurement result.


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