The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2022
Filed:
Mar. 09, 2017
Applicant:
Lg Chem, Ltd., Seoul, KR;
Inventors:
Boo Kyung Kim, Daejeon, KR;
Yeong Rae Chang, Daejeon, KR;
Jae Hoon Shim, Daejeon, KR;
Jin Young Park, Daejeon, KR;
Jae Pil Koo, Daejeon, KR;
Assignee:
LG CHEM, LTD., Seoul, KR;
Primary Examiner:
Int. Cl.
CPC ...
B32B 7/02 (2019.01); C09D 7/65 (2018.01); C09D 7/40 (2018.01); C09D 201/00 (2006.01); C09D 5/00 (2006.01);
U.S. Cl.
CPC ...
C09D 7/65 (2018.01); B32B 7/02 (2013.01); C09D 5/006 (2013.01); C09D 7/40 (2018.01); C09D 201/00 (2013.01); C09D 201/005 (2013.01);
Abstract
The present invention relates to an antireflection film including a low refractive index layer and a hard coating layer, the low refractive index layer including: a binder resin containing a crosslinked polymer of a photopolymerizable compound and a polysilsesquioxane substituted with one or more reactive functional groups; and inorganic fine particles dispersed in the binder resin, wherein a 10-point average roughness (Rz) of the shape of irregularities on the surface of the low refractive index layer is 0.05 μm to 0.2 μm.