The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 2022

Filed:

Aug. 30, 2019
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventor:

Shuichi Wakabayashi, Okaya, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 15/00 (2006.01); G05B 19/00 (2006.01); B25J 19/02 (2006.01); B25J 9/16 (2006.01); B25J 13/08 (2006.01); G06T 7/521 (2017.01);
U.S. Cl.
CPC ...
B25J 19/022 (2013.01); B25J 9/163 (2013.01); B25J 9/1697 (2013.01); B25J 13/08 (2013.01); B25J 19/023 (2013.01); G06T 7/521 (2017.01);
Abstract

A three-dimensional measuring apparatus includes a projection unit that projects a first pattern light and a second pattern light by a laser beam on a region containing an object, an imaging unit that images a captured image of the region, a vibration information receiving part that receives vibration information on a vibration of the projection unit or the imaging unit, and a measuring unit that measures a three-dimensional shape of the object based on the captured image, wherein the region on which the first pattern light having a first period is projected is imaged by the imaging unit when the vibration information is equal to or smaller than a first threshold value.


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