The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 2022

Filed:

Mar. 30, 2020
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventors:

Satoshi Sano, Kyoto, JP;

Koichi Tanabe, Kyoto, JP;

Yukihisa Wada, Kyoto, JP;

Satoshi Tokuda, Kyoto, JP;

Akira Horiba, Kyoto, JP;

Naoki Morimoto, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); G01N 23/041 (2018.01); A61B 6/04 (2006.01); G21K 1/06 (2006.01);
U.S. Cl.
CPC ...
A61B 6/484 (2013.01); A61B 6/0487 (2020.08); A61B 6/4035 (2013.01); A61B 6/4291 (2013.01); A61B 6/4435 (2013.01); G01N 23/041 (2018.02); G21K 1/06 (2013.01); G01N 2223/1016 (2013.01); G01N 2223/3303 (2013.01); G01N 2223/3307 (2013.01); G01N 2223/427 (2013.01); G21K 2207/005 (2013.01);
Abstract

In this X-ray phase imaging apparatus, at least one of a plurality of gratings is composed of a plurality of grating portions arranged along a third direction perpendicular to a first direction along which a subject or an imaging system is moved by a moving mechanism and a second direction along which an X-ray source, a detection unit, and a plurality of grating portions are arranged. The plurality of grating portions are arranged such that adjacent grating portions overlap each other when viewed in the first direction.


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