The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 2022

Filed:

Nov. 01, 2019
Applicant:

Prashant Choudhary, Milpitas, CA (US);

Inventor:

Prashant Choudhary, Milpitas, CA (US);

Assignee:

Other;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A47J 27/00 (2006.01); A23L 5/10 (2016.01); A47J 36/32 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
A47J 27/004 (2013.01); A23L 5/10 (2016.08); A47J 36/32 (2013.01); A47J 36/321 (2018.08); G06N 20/00 (2019.01);
Abstract

Image analysis for comparison utilizes a combined image distance determined between the one or more captured images and the one or more reference images from a dual path analysis. The dual path analysis can comprise a first image analysis based on histograms of image colors and a second image analysis based a one-dimensional power spectral density of a black and white instance of the one or more captured images and the one or more reference images. In one case, the one-dimensional power spectral density derived by integrating a Discrete Fourier Transform of a two-dimensional image over annular rings of substantially equal area starting from the center of the two-dimensional image.


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