The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 2022

Filed:

Feb. 17, 2021
Applicants:

The Ritsumeikan Trust, Kyoto, JP;

Ablic Inc., Tokyo, JP;

Inventors:

Takakuni Douseki, Shiga, JP;

Ami Tanaka, Shiga, JP;

Syuuichi Okamoto, Shiga, JP;

Ryoma Furumori, Shiga, JP;

Fumiyasu Utsunomiya, Tokyo, JP;

Assignees:

The Ritsumeikan Trust, Kyoto, JP;

ABLIC Inc., Tokyo, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A01G 27/00 (2006.01); A01G 9/24 (2006.01);
U.S. Cl.
CPC ...
A01G 27/003 (2013.01); A01G 9/247 (2013.01); A01G 27/008 (2013.01);
Abstract

A plant cultivation system includes: a first sensor configured to output a sensor signal corresponding to an amount of water in a plant; a second sensor configured to output a sensor signal corresponding to a measurement value of an environment condition; and a controller, wherein the controller is configured to, by using a sensor signal from the first sensor obtained by the first sensor measuring a plant to be cultivated and a sensor signal from the second sensor obtained by the second sensor measuring an environment for cultivating the plant to be cultivated, control a specific environment parameter corresponding to the environment condition and measured by the second sensor, in a cultivation environment for the plant to be cultivated.


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