The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2022

Filed:

Apr. 17, 2020
Applicant:

Direct Electron, Lp, San Diego, CA (US);

Inventors:

Benjamin Bammes, Pearland, TX (US);

Robert Bilhorn, San Diego, CA (US);

Assignee:

Direct Electron, LP, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/235 (2006.01); H04N 5/365 (2011.01); H04N 5/341 (2011.01); H01J 37/28 (2006.01); H04N 5/00 (2011.01);
U.S. Cl.
CPC ...
H04N 5/2355 (2013.01); H01J 37/28 (2013.01); H04N 5/00 (2013.01); H04N 5/341 (2013.01); H04N 5/3655 (2013.01); H01J 2237/24592 (2013.01); H01J 2237/2806 (2013.01); H01J 2237/2817 (2013.01);
Abstract

The present disclosure relates to transmission electron microscopy for evaluation of biological matter. According to an embodiment, the present disclosure further relates to an apparatus for determining the structure and/or elemental composition of a sample using 4D STEM, comprising a direct bombardment detector operating with global shutter readout, processing circuitry configured to acquire images of bright-field disks using either a contiguous array or non-contiguous array of detector pixel elements, correct distortions in the images, align each image of the images based on a centroid of the bright-field disk, calculate a radial profile of the images, normalize the radial profiles by a scaling factor, calculate the rotationally-averaged edge profile of the bright-field disk, and determine elemental composition within the specimen based on the characteristics of the edge profile of the bright-field disk corresponding to each specimen location.


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