The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2022

Filed:

Dec. 09, 2019
Applicant:

Sony Group Corporation, Tokyo, JP;

Inventors:

Hiroaki Nakano, Tokyo, JP;

Osamu Kozakai, Kanagawa, JP;

Shinji Komiyama, Saitama, JP;

Kenichi Fujimaki, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H02J 50/60 (2016.01); H02J 50/80 (2016.01); H02J 50/12 (2016.01);
U.S. Cl.
CPC ...
H02J 50/60 (2016.02); H02J 50/12 (2016.02); H02J 50/80 (2016.02); B60L 2240/36 (2013.01); Y02T 10/7072 (2013.01); Y02T 90/14 (2013.01); Y04S 30/14 (2013.01);
Abstract

Methods and apparatus for detecting the presence of undesirable foreign matter in a region between a wireless power transmission apparatus and a power reception apparatus are described. First and second detection methods, based on different detection schemes, may be used to detect and distinguish the presence of foreign matter from misalignment during power transfer operation. A first detection method may be used before power is transferred to a load in a power reception apparatus, and a second detection method may be used while power is supplied to the load.


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