The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2022

Filed:

May. 31, 2017
Applicant:

Semiconductor Energy Laboratory Co., Ltd., Atsugi, JP;

Inventors:

Masahiro Watanabe, Tochigi, JP;

Takuya Handa, Tochigi, JP;

Yasuharu Hosaka, Tochigi, JP;

Kenichi Okazaki, Tochigi, JP;

Shunpei Yamazaki, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C 14/08 (2006.01); H01L 21/02 (2006.01); C23C 14/34 (2006.01); H01J 37/34 (2006.01); H01L 29/786 (2006.01); H01L 29/66 (2006.01); H01L 21/67 (2006.01); C23C 14/54 (2006.01); C23C 14/56 (2006.01); H01L 21/687 (2006.01); H01L 27/32 (2006.01); G02F 1/1343 (2006.01); G02F 1/1368 (2006.01); G02F 1/13 (2006.01);
U.S. Cl.
CPC ...
H01L 21/02631 (2013.01); C23C 14/086 (2013.01); C23C 14/3407 (2013.01); C23C 14/3457 (2013.01); C23C 14/54 (2013.01); C23C 14/564 (2013.01); C23C 14/566 (2013.01); H01J 37/3426 (2013.01); H01L 21/02565 (2013.01); H01L 21/67017 (2013.01); H01L 21/6719 (2013.01); H01L 21/67196 (2013.01); H01L 21/67201 (2013.01); H01L 21/67207 (2013.01); H01L 21/68764 (2013.01); H01L 29/66969 (2013.01); H01L 29/7869 (2013.01); H01L 29/78633 (2013.01); H01L 29/78648 (2013.01); G02F 1/1303 (2013.01); G02F 1/1368 (2013.01); G02F 1/134309 (2013.01); H01L 27/3262 (2013.01);
Abstract

To provide a sputtering apparatus capable of forming a semiconductor film in which impurities such as hydrogen or water are reduced. The sputtering apparatus is capable of forming a semiconductor film and includes a deposition chamber, a gas supply device connected to the deposition chamber, a gas refining device connected to the gas supply device, a vacuum pump for evacuating the deposition chamber, a target disposed in the deposition chamber, and a cathode disposed to face the target. The gas supply device is configured to supply at least one of an argon gas, an oxygen gas, and a nitrogen gas. The partial pressure of hydrogen molecules is lower than or equal to 0.01 Pa and the partial pressure of water molecules is lower than or equal to 0.0001 Pa in the deposition chamber.


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