The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2022

Filed:

May. 02, 2019
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Shigetoshi Ishikawa, Kanagawa, JP;

Hirona Yumbe, Kanagawa, JP;

Akemi Oda, Kanagawa, JP;

Yasuhisa Kaneko, Kanagawa, JP;

Keiji Tsubota, Kanagawa, JP;

Haruyasu Nakatsugawa, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G16H 30/40 (2018.01); A61B 1/00 (2006.01); G06F 9/30 (2018.01);
U.S. Cl.
CPC ...
G16H 30/40 (2018.01); A61B 1/00048 (2013.01); G06F 9/3004 (2013.01);
Abstract

A display control device includes: a display control unit that displays a graph representing a history of inspection results including a last inspection result of a subject individual and a predetermined number of previous inspection results from the last inspection result for a predetermined inspection item among plural inspection items in the subject, the graph having a first axis representing the inspection results and a second axis representing a time series, and performs control for displaying information representing plural inspection results of at least one of the subject individual or the same variety as a variety of the subject individual on a position corresponding to a specific point of time of the second axis along a direction of the first axis with a different color or density according to a frequency of each inspection result.


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