The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2022

Filed:

Dec. 14, 2020
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Zachary A. Silverstein, Jacksonville, FL (US);

Trudy L. Hewitt, Cary, NC (US);

Saswati Dana, Bangalore, IN;

Mayoore Selvarasa Jaiswal, Austin, TX (US);

Jonathan D. Dunne, Dungarvan, IE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 11/20 (2006.01); G06V 30/422 (2022.01); G06F 16/901 (2019.01);
U.S. Cl.
CPC ...
G06T 11/206 (2013.01); G06V 30/422 (2022.01); G06F 16/9024 (2019.01);
Abstract

A computer-implemented method is provided. The embodiments include evaluating, by one or more processors, a specimen chart relative to a chart erratum model that has features mapped to an optimum state for a first chart type. The method also includes generating a first risk score for a first sample feature of the specimen chart. The first risk score may include a delta from the optimum state. The method also includes refactoring the specimen chart to mitigate the first risk score of the first sample feature.


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