The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2022
Filed:
Sep. 28, 2020
United States of America As Represented BY the Administrator of Nasa, Washington, DC (US);
Jacqueline J. Le Moigne-Stewart, Greenbelt, MD (US);
David Solarna, Genoa, IT;
Gabriele Moser, Genoa, IT;
Sebastiano Serpico, Genoa, IT;
United States of America as represented by the Administrator of NASA, Washington, DC (US);
Abstract
The present invention relates to a novel method and system for crater detection in planetary data based on marked point processes (MPP), effective for various object detection tasks in Earth observation, and for planetary image registration. The resulting spatial features are exploited for registration, together with fitness functions based on the MPP energy, on the mean directed Hausdorff distance, and on the mutual information. Two different methods—one based on birth-death processes and region-of-interest analysis, and the other based on graph cuts and decimated wavelets—are included within the present framework. Experimental results confirmed the effectiveness of the present invention in terms of crater detection performance and sub-pixel registration accuracy.