The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2022
Filed:
Mar. 28, 2018
Amazon Technologies, Inc., Seattle, WA (US);
Dilip Kumar, Seattle, WA (US);
Liefeng Bo, Seattle, WA (US);
Nikhil Chacko, Seattle, WA (US);
Robert Crandall, Seattle, WA (US);
Nishitkumar Ashokkumar Desai, Redmond, WA (US);
Jayakrishnan Kumar Eledath, Kenmore, WA (US);
Gopi Prashanth Gopal, Redmond, WA (US);
Gerard Guy Medioni, Seattle, WA (US);
Paul Eugene Munger, Seattle, WA (US);
Kushagra Srivastava, Issaquah, WA (US);
AMAZON TECHNOLOGIES, INC., Seattle, WA (US);
Abstract
Sensor data from load cells at a shelf is processed using a first time window to produce first event data describing coarse and sub-events. Location data is determined that indicates where on the shelf weight changes occurred at particular times. Hypotheses are generated using information about where items are stowed, weights of those of items, type of event, and the location data. If confidence values of these hypotheses are below a threshold value, second event data is determined by merging adjacent sub-events. This second event data is then used to determine second hypotheses which are then assessed. A hypothesis with a high confidence value is used to generate interaction data indicative of picks or places of particular quantities of particular types of items from the shelf.