The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2022

Filed:

Dec. 13, 2019
Applicant:

Snap Inc., Santa Monica, CA (US);

Inventors:

Landon Anderton, Salt Lake City, UT (US);

Garrett Gee, Los Angeles, CA (US);

Ryan Hornberger, Playa Vista, CA (US);

Kirk Ouimet, Orem, UT (US);

Kameron Sheffield, South Jordan, UT (US);

Benjamin Turley, Lehi, UT (US);

Assignee:

Snap Inc., Santa Monica, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 7/14 (2006.01); G06K 9/32 (2006.01); G06K 19/06 (2006.01);
U.S. Cl.
CPC ...
G06K 7/1443 (2013.01); G06K 7/1413 (2013.01); G06K 7/1417 (2013.01); G06K 7/1456 (2013.01); G06K 9/3216 (2013.01); G06K 19/06037 (2013.01); G06K 19/06103 (2013.01); G06K 19/06131 (2013.01);
Abstract

Systems and methods for custom functional patterns for optical barcodes are provided. In example embodiments, image data of an image is received from a user device. A candidate shape feature of the image is extracted from the image data. A determination is made that the shape feature satisfies a shape feature rule. In response to the candidate shape feature satisfying the shape feature rule, a custom graphic in the image is identified by comparing the candidate shape feature with a reference shape feature of the custom graphic. In response to identifying the custom graphic, data encoded in a portion of the image is decoded.


Find Patent Forward Citations

Loading…