The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2022

Filed:

Nov. 25, 2020
Applicant:

Fujitsu Limited, Kawasaki, JP;

Inventors:

Hironobu Kitajima, Kawasaki, JP;

Tetsuya Kashiwagi, Fukuoka, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/15 (2006.01); G16H 40/63 (2018.01);
U.S. Cl.
CPC ...
G06F 17/15 (2013.01); G16H 40/63 (2018.01);
Abstract

A first time-series data set indicating first measured values obtained by a first device and a second time-series data set indicating second measured values obtained by a second device are obtained. First alignment is performed to convert the positions in the time domain of the first measured values belonging to a second period, based on the first measured values belonging to a first period. Second alignment is performed to convert the positions in the time domain of the second measured values belonging to the second period, based on a relationship between positions before and after the conversion. Correlation analysis is performed between third and fourth time-series data sets respectively obtained by the first and second alignment. The existence or absence of an inclusion relationship in which the second measured values contain a component of the first measured values is determined based on the correlation analysis result.


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