The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2022
Filed:
Sep. 18, 2017
Applicant:
Oracle International Corporation, Redwood Shores, CA (US);
Inventors:
Yaser I. Suleiman, Santa Clara, CA (US);
Michael Zoll, Foster City, CA (US);
Subhransu Basu, Fremont, CA (US);
Angelo Pruscino, Los Altos, CA (US);
Wolfgang Lohwasser, Munich, DE;
Wataru Miyoshi, Redwood City, CA (US);
Thomas Breidt, Munich, DE;
Thomas Herter, Santa Clara, CA (US);
Klaus Thielen, Munich, DE;
Sahil Kumar, Redwood City, CA (US);
Assignee:
Oracle International Corporation, Redwood Shores, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/21 (2019.01); G06F 16/215 (2019.01); G06K 9/62 (2022.01); G06F 11/34 (2006.01); G06N 20/20 (2019.01); H04L 41/142 (2022.01); G06N 7/00 (2006.01); H04L 41/069 (2022.01); G06N 20/00 (2019.01); H04L 41/0695 (2022.01); H04L 41/0823 (2022.01); H04L 43/02 (2022.01);
U.S. Cl.
CPC ...
G06F 16/215 (2019.01); G06F 11/3409 (2013.01); G06F 11/3452 (2013.01); G06K 9/6256 (2013.01); G06N 7/005 (2013.01); G06N 20/20 (2019.01); H04L 41/069 (2013.01); H04L 41/142 (2013.01); G06N 20/00 (2019.01); H04L 41/0695 (2013.01); H04L 41/0823 (2013.01); H04L 43/02 (2013.01);
Abstract
Described is an improved approach to remove data outliers by filtering out data correlated to detrimental events within a system. One or more detrimental even conditions are defined to identify and handle abnormal transient states from collected data for a monitored system.