The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2022

Filed:

Mar. 18, 2019
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventors:

Wei Luo, Yamanashi, JP;

Junichi Tezuka, Yamanashi, JP;

Tadashi Okita, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/418 (2006.01);
U.S. Cl.
CPC ...
G05B 19/4183 (2013.01); G05B 19/41835 (2013.01);
Abstract

To provide an observation apparatus, an observation method, and an observation program capable of presenting a point of interest for finding a wasteful waiting time of a machine. The observation apparatus includes an observation data acquisition unit configured to acquire observation data on an operation status of a machine along with time information, an extraction unit configured to extract, on the basis of a first condition relating to the observation data, a time range of the observation data corresponding to an operation of the machine, the operation having a possibility of generating a waiting time, and an output unit configured to output information on the extracted time range.


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