The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2022
Filed:
Feb. 25, 2020
Fanuc Corporation, Yamanashi, JP;
Kouya Okudera, Yamanashi, JP;
Hiroki Mukai, Yamanashi, JP;
Yuuya Miyahara, Yamanashi, JP;
Yasushi Okajima, Yamanashi, JP;
Shinichi Ogawa, Yamanashi, JP;
Noboru Kurokami, Yamanashi, JP;
FANUC CORPORATION, Yamanashi, JP;
Abstract
Provided is a defect occurrence prediction system for a machine tool that makes it possible to identify the factors causing the occurrence of defects efficiently and effectively, and predict the occurrence of the defects accurately with good precision. A defect occurrence prediction system includes an information data accumulation unit that accumulates various types of information and various types of data relating to a machining operation of the machine tool; a defective product occurrence information data extraction unit that extracts from the information data accumulation unit the various types of information and the various types of data when the defective product is produced in the machined products; and a defect occurrence prediction unit that performs a defect occurrence prediction on a basis of the various types of information and the various types of data extracted by the defective product occurrence information data extraction unit and various types of information and various types of data relating to a machining operation of the machine tool obtained in real time.