The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2022

Filed:

Sep. 19, 2018
Applicant:

Imec Vzw, Leuven, BE;

Inventors:

Abdulkadir Yurt, Heverlee, BE;

Richard Stahl, Rotselaar, BE;

Murali Jayapala, Kessel-Lo, BE;

Geert Vanmeerbeeck, Keerbergen, BE;

Assignee:

IMEC VZW, Leuven, BE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G03H 1/04 (2006.01);
U.S. Cl.
CPC ...
G03H 1/0443 (2013.01); G03H 1/0465 (2013.01); G03H 2001/0447 (2013.01); G03H 2001/0452 (2013.01); G03H 2001/0471 (2013.01); G03H 2222/13 (2013.01); G03H 2222/34 (2013.01); G03H 2222/42 (2013.01); G03H 2222/43 (2013.01); G03H 2222/45 (2013.01); G03H 2222/52 (2013.01); G03H 2223/16 (2013.01); G03H 2226/13 (2013.01);
Abstract

Example embodiments relate to imaging devices for in-line holographic imaging of objects. One embodiment includes an imaging device for in-line holographic imaging of an object. The imaging device includes a set of light sources configured to output light in confined illumination cones. The imaging device also includes an image sensor that includes a set of light-detecting elements. The set of light sources are configured to output light such that the confined illumination cones are arranged side-by-side and illuminate a specific part of the object. The image sensor is arranged such that the light-detecting elements detect a plurality of interference patterns. Each interference pattern is formed by diffracted light from the object originating from a single light source and undiffracted light from the same single light source. At least a subset of the set of light-detecting elements is arranged to detect light relating to not more than one interference pattern.


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