The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2022
Filed:
Oct. 24, 2014
Ultrahaptics Ip Two Limited, Bristol, GB;
David S. Holz, San Francisco, CA (US);
Robert Samuel Gordon, San Bruno, CA (US);
Gabriel A. Hare, San Francisco, CA (US);
Neeloy Roy, San Francisco, CA (US);
Maxwell Sills, San Francisco, CA (US);
Paul Durdik, Foster City, CA (US);
Ultrahaptics IP Two Limited, Bristol, GB;
Abstract
The technology disclosed relates to determining positional information about an object of interest is provided. In particular, it includes, conducting scanning of a field of interest with an emission from a transmission area according to an ordered scan pattern. The emission can be received to form a signal based upon at least one salient property (e.g., intensity, amplitude, frequency, polarization, phase, or other detectable feature) of the emission varying with time at the object of interest. Synchronization information about the ordered scan pattern can be derived from a source, a second signal broadcast separately, social media share, others, or and/or combinations thereof). A correspondence between at least one characteristic of the signal and the synchronization information can be established. Positional information can be determined based at least in part upon the correspondence.