The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2022

Filed:

Mar. 03, 2014
Applicant:

Electro Industries/gauge Tech., Westbury, NY (US);

Inventors:

Joseph Spanier, Brooklyn, NY (US);

Hai Zhu, Westbury, NY (US);

Wei Wang, Mahwah, NJ (US);

Assignee:

Electro Industries/Gauge Tech, Westbury, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 19/04 (2006.01); G06F 19/00 (2011.01); G01R 19/25 (2006.01); G01R 1/40 (2006.01); G06F 17/40 (2006.01); G06F 11/30 (2006.01); G01R 29/02 (2006.01); G16Z 99/00 (2019.01);
U.S. Cl.
CPC ...
G01R 19/2509 (2013.01); G01R 1/40 (2013.01); G01R 19/2513 (2013.01); G01R 19/04 (2013.01); G01R 29/02 (2013.01); G06F 11/30 (2013.01); G06F 17/40 (2013.01); G16Z 99/00 (2019.02);
Abstract

A system and a method is provided for the detection and capture, and in particular for an ultra high speed detection and capture, of transients in input voltages by an intelligent electronic device. The system and method detects transients for input voltages in either phase to phase or phase to neutral measurements and permits a user to set threshold levels for detecting transients in input voltages. In an embodiment, the system and method further provides a field programmable gate array as a controller for managing transient detection. The field programmable gate array includes a state machine for determining the state of the sampled signal with respect to a threshold level at a specified waveform sample period.


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