The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2022
Filed:
May. 11, 2017
S.d. Sight Diagnostics Ltd., Tel Aviv, IL;
Joseph Joel Pollak, Neve Daniel, IL;
Sarah Levy Schreier, Tel Aviv, IL;
Yochay Shlomo Eshel, Sde Warburg, IL;
Amir Zait, Rehovot, IL;
Sharon Pecker, Rehovot, IL;
Trevor Ruggiero, Somerville, MA (US);
S.D. Sight Diagnostics Ltd., Tel Aviv, IL;
Abstract
Apparatus and methods are described for determining a property of a biological sample. A sample carrier () includes one or more sample chambers () that define at least a first region () and a second region (), the height of the one or more sample chambers varying between the first and second regions in a predefined manner. A computer processor () receives data relating to a first optical measurement that is performed upon a portion of the sample that is disposed within the first region, receives data relating to a second optical measurement that is performed upon a portion of the sample that is disposed within the second region, and determines the property of the sample by using a relationship between the first optical measurement, the second optical measurement, and the predefined variation in height between the regions. Other applications are also described.