The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2022

Filed:

Oct. 25, 2018
Applicant:

Smiths Detection Montreal, Inc., Mississauga, CA;

Inventors:

Bohdan Atamanchuk, Mississauga, CA;

Volodimir Bondarenko, Toronto, CA;

Vlad Sergeyev, Toronto, CA;

Henryk Zaleski, Scarborough, CA;

Daniel Levin, Woodbridge, CA;

Mark Piniarski, Mississauga, CA;

Igor Kubelik, Mississauga, CA;

Qunzhou Bian, Milton, CA;

Simon Feldberg, Vaughan, CA;

Douglas J. Green, Baldwin, MD (US);

Brian Boso, Bel Air, MD (US);

Atin J. Patel, Mississauga, CA;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/622 (2021.01); H01J 49/00 (2006.01); H01J 49/06 (2006.01); H01C 3/06 (2006.01); H05K 1/11 (2006.01);
U.S. Cl.
CPC ...
G01N 27/622 (2013.01); H01C 3/06 (2013.01); H01J 49/0018 (2013.01); H01J 49/06 (2013.01); H01J 49/062 (2013.01); H05K 1/118 (2013.01);
Abstract

An ion detection assembly is described that includes a drift chamber, an inlet assembly, and a collector assembly. The drift chamber is formed of substantially non-conductive material and/or semi-conductive material. A patterned resistive trace is deposited on one or more of an interior surface or an exterior surface of the drift chamber. The patterned resistive trace is configured to connect to a source of electrical energy. The inlet assembly and the collector assembly are in fluid communication with the drift chamber. The inlet assembly includes an inlet for receiving a sample, a reaction region for ionizing the sample, and a gate for controlling entrance of the ionized sample to the drift chamber. The collector assembly includes a collector plate for collecting the ionized sample after the ionized sample passes through the drift chamber.


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