The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2022

Filed:

Apr. 22, 2020
Applicant:

Han's Laser Technology Industry Group Co., Ltd, Shenzhen, CN;

Inventors:

Sheng Lin Wang, Shenzhen, CN;

Hao Liu, Shenzhen, CN;

Da Chang Hu, Shenzhen, CN;

Yong Hu, Shenzhen, CN;

Peng Fei Lei, Shenzhen, CN;

Ji Guo Liu, Shenzhen, CN;

Zuo Bin Xu, Shenzhen, CN;

Yun Feng Gao, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/20 (2006.01); G01N 33/207 (2019.01); G01N 27/04 (2006.01);
U.S. Cl.
CPC ...
G01N 27/20 (2013.01); G01N 27/041 (2013.01); G01N 33/207 (2019.01);
Abstract

The present disclosure relates to a welding quality detecting field, and specifically relates to a quality detection device. The quality detection device includes an integrated probe set, a driving module and a collecting module. The integrated probe set includes a plurality of integrated probe assemblies. The integrated probe assemblies are disposed in pairs and each integrated probe assembly includes a driving end and a collecting end. The driving end of one integrated probe assembly is matched with the driving end of another integrated probe assembly disposed in pairs with the one integrated probe assembly. The collecting end of one integrated probe assembly is matched with the collecting end of another integrated probe assembly disposed in pairs with the one integrated probe assembly.


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