The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2022
Filed:
May. 05, 2020
Caastle, Inc., New York, NY (US);
Alyssa Packard, Asheville, OH (US);
Shannon Gramley, Columbus, OH (US);
Lindsey Winland, Dublin, OH (US);
CaaStle, Inc., New York, NY (US);
Abstract
A method of inspecting an article with a defect detection tool includes receiving one or more articles at an inspection station and inspecting one of the received one or more articles by evaluating the article for at least one physical defect with the defect detection tool. The defect detection tool includes a clear body including a surface element sized to correspond to the at least one physical defect in the article. Evaluating the article for at least one physical defect with the defect detection tool includes applying the defect detection tool against the article to align the surface element with a potential physical defect in the surface of the article and determining that the at least one physical defect is present when the potential physical defect has a size equal to or larger than a size of the linear element or a size of the circular element.