The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2022

Filed:

Nov. 27, 2019
Applicants:

National Central University, Taoyuan, TW;

Huan-cheng Chang, Taoyuan, TW;

Inventors:

Min-Chun Pan, Taoyuan, TW;

Ya-Fen Hsu, Taoyuan, TW;

Yan-Yang Hsu, Taoyuan, TW;

Assignees:

National Central University, Taoyuan, TW;

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 11/00 (2006.01); G01J 1/44 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
G01J 1/44 (2013.01); G06T 11/003 (2013.01); A61B 5/0073 (2013.01); G01J 2001/4413 (2013.01); G01J 2001/4453 (2013.01);
Abstract

An optical tomography imaging system includes a signal generator, at least one light emitter, at least one light receiver, a signal processor, and an image processor. The signal generator is configured to generate a periodic signal and a reference signal. The light emitter is configured to be activated by the periodic signal to generate an optical signal passing through an object under test. The light receiver is configured to receive and convert the optical signal passing through the object under test into an electrical signal. The signal processor is configured to generate a comparison signal according to the electrical signal and the reference signal. The image processor is configured to acquire a plurality of disassembled sine waves from the comparison signal and generate a reconstructed image according to the disassembled sine waves.


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