The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2022

Filed:

Jan. 27, 2021
Applicant:

Lavision Biotec Gmbh, Bielefeld, DE;

Inventors:

Frank Killich, Gottingen, DE;

Uwe Engeland, Gottingen, DE;

Assignee:

LaVision BioTec GmbH, Bielefeld, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/42 (2006.01); G01J 1/04 (2006.01); G01J 1/02 (2006.01); G02B 5/00 (2006.01);
U.S. Cl.
CPC ...
G01J 1/4257 (2013.01); G01J 1/0266 (2013.01); G01J 1/0411 (2013.01); G01J 1/0414 (2013.01); G01J 1/4228 (2013.01); G02B 5/001 (2013.01); G01J 1/0425 (2013.01);
Abstract

A radiation field measuring device for the characterization of a radiation comprises a detector device and a reconstruction device. The detector device may have at least one detector camera, which contains at least one detector array arranged for the image recording of scattered radiation in a multiplicity of lateral directions that deviate from the longitudinal direction. The reconstruction device may be configured for the tomographic reconstruction of a field density of the scattered radiation in the radiation field.


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Killich, Frank. (2022). Measuring device and methods for characterization of a radiation field (U.S. Patent No. 11307086). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11307086

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