The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2022

Filed:

Apr. 06, 2018
Applicant:

Hewlett-packard Development Company, L.p., Spring, TX (US);

Inventors:

Justin M. Roman, Vancouver, WA (US);

Luke Sosnowski, Vancouver, WA (US);

David Soriano, Vancouver, WA (US);

Emiliano Gabriel Tolosa Gonzalez, Sant Cugat del Valles, ES;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29C 64/393 (2017.01); B33Y 10/00 (2015.01); B33Y 30/00 (2015.01); B33Y 50/02 (2015.01); B29C 64/364 (2017.01); B29C 64/357 (2017.01); B29C 64/255 (2017.01);
U.S. Cl.
CPC ...
B29C 64/393 (2017.08); B29C 64/255 (2017.08); B29C 64/357 (2017.08); B29C 64/364 (2017.08); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12);
Abstract

A system for manufacturing three dimensional objects can include logic to detect, for at least one vessel, a moisture content level corresponding to a build material residing in the at least one vessel. The logic can also adjust a humidity level and a temperature of a gas and a conditioning agent applied to the at least one vessel, wherein the humidity level and the temperature are based on the moisture content level and a temperature of the build material residing in the at least one vessel. Additionally, the logic can initialize manufacturing a three dimensional object with the build material from the at least one vessel in response to detecting the moisture content level of the build material residing in the at least one vessel is within a predetermined range.


Find Patent Forward Citations

Loading…