The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2022
Filed:
Jan. 17, 2019
Leica Instruments (Singapore) Pte. Ltd., Singapore, SG;
Jason Huang, Singapore, SG;
Chin Yi Liaw, Singapore, SG;
LEICA INSTRUMENTS (SINGAPORE) PTE. LTD., Singapore, SG;
Abstract
The invention relates to a method for automatedly aligning a stand () for a microscope (), wherein the stand () for the microscope () comprises controllable positioning means () for positioning the microscope () and controllable orienting means () for orienting the microscope (). The method comprises defining a target point () to be observed by the microscope (), wherein the target point () is located within a coordinate range accessible by the stand (), stabilizing the microscope () at a user determined position in an automated manner by means of the controllable positioning means () of the stand, and adjusting an orientation of the microscope () at the user determined position to the target point () in an automated manner using the controllable orienting means () of the stand. The invention further relates to a stand, a microscope assembly (), a control unit, a computer program and a computer-readable data storage.