The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 12, 2022

Filed:

Aug. 31, 2020
Applicant:

Kioxia Corporation, Tokyo, JP;

Inventors:

Kosuke Yanagidaira, Kanagawa, JP;

Takuyo Kodama, Kanagawa, JP;

Takeshi Hioka, Tokyo, JP;

Assignee:

KIOXIA CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/34 (2006.01); G11C 16/26 (2006.01); G11C 16/08 (2006.01); G11C 16/04 (2006.01); H01L 27/115 (2017.01);
U.S. Cl.
CPC ...
G11C 16/26 (2013.01); G11C 16/0483 (2013.01); G11C 16/08 (2013.01); H01L 27/115 (2013.01);
Abstract

A semiconductor storage device includes first and second memory cells, first and second word lines connected to the first and second memory cells, respectively, a bit line connected to the first and second memory cells, and a sense amplifier including a sense node. During a first read, a controller applies a first read voltage to the second word line and determines a read result. During a second read, the controller discharges the sense node for a first time period while applying a second read voltage to the first word line to determine a first read result, and discharges the sense node for a second time period while applying the second read voltage to determine a second read result. The controller determines read data based on the first read result, the second read result, and the read result of the second memory cell.


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