The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2022
Filed:
Feb. 14, 2019
Omron Corporation, Kyoto, JP;
OMRON Corporation, Kyoto, JP;
Abstract
A three-dimensional measurement system capable of realizing high-speed processing while increasing measurement resolution are provided. The system includes: an image capture unit including a first and second image capture units that are spaced apart; a first calculation unit calculates a parallax at first feature points in the images using distance information of a three-dimensional measurement method other than a stereo camera method or information for calculating a distance, using at least one of the first and second image capture units; and a second calculation unit calculates a parallax at second feature points based on a corresponding point for the second feature point by using the stereo camera method using the first and second image capture units, and specifies a three-dimensional shape based on the parallax at the first and second feature points. The second calculation unit sets a search area based on the parallax at the first feature points.