The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 12, 2022

Filed:

Aug. 19, 2019
Applicant:

Fotonation Limited, Galway, IE;

Inventors:

Ruxandra Vranceanu, Brasov, RO;

Tudor Mihail Pop, Brasov, RO;

Oana Parvan-Cernatescu, Brasov, RO;

Sathish Mangapuram, Galway, IE;

Assignee:

FotoNation Limited, Galway, IE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/11 (2017.01); G06K 9/00 (2006.01); G06N 3/04 (2006.01); G06F 17/15 (2006.01);
U.S. Cl.
CPC ...
G06T 7/11 (2017.01); G06F 17/15 (2013.01); G06K 9/00248 (2013.01); G06N 3/04 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/20132 (2013.01);
Abstract

A method of generating landmark locations for an image crop comprises: processing the crop through an encoder-decoder to provide a plurality of N output maps of comparable spatial resolution to the crop, each output map corresponding to a respective landmark of an object appearing in the image crop; processing an output map from the encoder through a plurality of feed forward layers to provide a feature vector comprising N elements, each element including an (x,y) location for a respective landmark. Any landmarks locations from the feature vector having an x or a y location outside a range for a respective row or column of the crop are selected for a final set of landmark locations; with remaining landmark locations tending to be selected from the N (x,y) landmark locations from the plurality of N output maps.


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