The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2022
Filed:
Apr. 10, 2020
General Electric Company, Schenectady, NY (US);
Alberto Santamaria-Pang, Schenectady, NY (US);
Yousef Al-Kofahi, Niskayuna, NY (US);
Aritra Chowdhury, Albany, NY (US);
Shourya Sarcar, Niskayuna, NY (US);
Michael John MacDonald, Albany, NY (US);
Peter Arjan Wassenaar, Morrow, OH (US);
Patrick Joseph Howard, Cincinnati, OH (US);
Bruce Courtney Amm, Clifton Park, NY (US);
Eric Seth Moderbacher, San Diego, CA (US);
General Electric Company, Schenectady, NY (US);
Abstract
An image inspection computing device is provided. The device includes a memory device and at least one processor. The at least one processor is configured to receive at least one sample image of a first component, wherein the at least one sample image of the first component does not include defects, store, in the memory, the at least one sample image, and receive an input image of a second component. The at least one processor is also configured to generate an encoded array based on the input image of the second component, perform a stochastic data sampling process on the encoded array, generate a decoded array, and generate a reconstructed image of the second component, derived from the stochastic data sampling process and the decoded array. The at least one processor is further configured to produce a residual image, and identify defects in the second component.