The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2022
Filed:
Mar. 20, 2020
Chiyoda Corporation, Yokohama, JP;
Kazuya Furuichi, Yokohama, JP;
Akihito Ikarashi, Yokohama, JP;
Shizuka Ikawa, Yokohama, JP;
Kenichi Mimura, Yokohama, JP;
CHIYODA CORPORATION, Yokohama, JP;
Abstract
An inspection support system comprising: determination devices that determine pass or fail based on a result of non-destructive inspection of the object; and a learning device that learns a determination algorithm used to determine pass or fail based on information collected from the determination devices. The determination device transmits an ultimate determination result yielded by an inspection person who has checked a determination result to the learning device along with the corresponding result of non-destructive inspection of the object. The learning device includes: a determination result reception unit that receives the ultimate determination result and the result of non-destructive inspection of the inspection object; a learning unit that learns the determination algorithm based on received information; and a provision unit that provides the learned determination algorithm to the determination devices.