The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2022
Filed:
Dec. 17, 2019
Applicants:
Ajou University Industry-academic Cooperation Foundation, Suwon-si, KR;
Dongguk University Industry-academic Cooperation Foundation, Seoul, KR;
Inventors:
Won Jun Hwang, Seoul, KR;
Ho Chul Sin, Yongin-si, KR;
Dong Yi Kim, Suwon-si, KR;
Soo Chul Lim, Seoul, KR;
Dae Kwan Ko, Seoul, KR;
Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2022.01); G06V 10/75 (2022.01);
U.S. Cl.
CPC ...
G06K 9/6232 (2013.01); G06V 10/75 (2022.01);
Abstract
A method of measuring an interaction force includes: generating feature maps corresponding to a plurality of sequential images; generating pooling maps respectively corresponding to feature map groups including a predetermined number of feature maps among the feature maps; generating attention maps corresponding to the pooling maps; and sequentially receiving feature maps modified based on the attention maps and outputting interaction force information.