The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 12, 2022

Filed:

Jul. 27, 2020
Applicant:

Aisin Corporation, Kariya, JP;

Inventors:

Yoshihito Kokubo, Kariya, JP;

Yoshihisa Suetsugu, Kariya, JP;

Jun Adachi, Kariya, JP;

Hiroyuki Watanabe, Kariya, JP;

Koki Ueda, Kariya, JP;

Assignee:

AISIN CORPORATION, Kariya, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/50 (2006.01); G06K 9/62 (2006.01); G08G 1/01 (2006.01); G08G 1/14 (2006.01); G08G 1/16 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00812 (2013.01); G06K 9/50 (2013.01); G06K 9/6256 (2013.01);
Abstract

A specific area detection device that detects a specific area in an imaging area based on a captured image includes: an estimation unit configured to estimate a plurality of points and a direction of a straight line connecting two predetermined points among the plurality of points from a captured image using a learning model created by learning about a specific area defined by a predetermined number of the points in an imaging area using a captured image for learning; and a detection unit configured to detect the specific area by classifying the plurality of points for each specific area based on the direction.


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