The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 12, 2022

Filed:

Sep. 29, 2020
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Jason Patrick Byrne, Newbridge, IE;

Kinshuk Pahare, Fremont, CA (US);

Warren Robert Russell, Dublin, IE;

Assignee:

AMAZON TECHNOLOGIES, INC., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/32 (2006.01); G06F 11/30 (2006.01); G06F 9/54 (2006.01); G06F 11/273 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/327 (2013.01); G06F 9/54 (2013.01); G06F 11/0772 (2013.01); G06F 11/2733 (2013.01); G06F 11/301 (2013.01); G06F 11/3006 (2013.01);
Abstract

Disclosed are various embodiments for automated testing of systems and applications. A computing device can receive a command to execute a test, the test comprising at least one fault instruction and an alarm, the alarm being specified as an evaluation criterion for the test. The computing device can then send the fault instruction to a fault injection service. Next, the computing device can receive a message from a monitoring service, the message indicating that the alarm has been triggered subsequent to sending the fault instruction to the fault injection service. Subsequently, the computing device can determine that the test has failed based at least in part on the alarm being triggered. Finally, the computing device can send a failure notification to a predefined recipient in response to detecting that the alarm has been triggered.


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Byrne, Jason. (2022). Automated testing of systems and applications (U.S. Patent No. 11301350). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11301350

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