The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 12, 2022

Filed:

Jul. 01, 2020
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Takeru Chiba, Tokyo, JP;

Masakuni Agetsuma, Tokyo, JP;

Takahiro Yamamoto, Tokyo, JP;

Hiroto Ebara, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01); G06F 11/20 (2006.01);
U.S. Cl.
CPC ...
G06F 3/061 (2013.01); G06F 3/0653 (2013.01); G06F 3/0679 (2013.01); G06F 11/2094 (2013.01);
Abstract

An object is to construct a storage system with a configuration with a high degree of freedom while ensuring a certain fault tolerance. The storage system includes a plurality of nodes that process an I/O processing request of data. The node has a storage device and a processor that performs the I/O processing on the storage device. The processor constitutes a data redundancy configuration in which data stored in different storage devices is combined as a data set. A management unit for managing the storage system performs a fault tolerance calculation of calculating fault tolerance information for a failure of each component by using component information that is information of a component including at least the and the storage device, and by using data redundancy configuration information related to the data redundancy configuration, and determines a data arrangement by applying the data redundancy configuration related to the calculated fault tolerance information.


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