The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 12, 2022

Filed:

Nov. 20, 2017
Applicant:

Korea Advanced Institute of Science and Technology, Daejeon, KR;

Inventors:

Sung-Eui Yoon, Daejeon, KR;

Youngsun Kwon, Daejeon, KR;

Donghyuk Kim, Daejeon, KR;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01S 17/89 (2020.01); B25J 9/16 (2006.01); G01S 7/48 (2006.01); G05D 1/02 (2020.01);
U.S. Cl.
CPC ...
G05D 1/0214 (2013.01); B25J 9/1664 (2013.01); G01S 7/4808 (2013.01); G01S 17/89 (2013.01); G05D 1/0231 (2013.01); Y10S 901/46 (2013.01); Y10S 901/47 (2013.01);
Abstract

A method and system for updates an occupancy map based on a first ray determined from a plurality of rays, as known as a super ray. The method of updating an occupancy map based on grids and octrees includes the step of generating a mapping line based on point clouds obtained from a sensor, determining a super ray by identifying a cell belonging to a plurality of cells forming the occupancy map and traversing an identical cell based on the generated mapping line, and updating the occupancy map by updating a cell through which the super ray corresponding to some of rays related to the plurality of cells forming the occupancy map passes.


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