The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 12, 2022

Filed:

Sep. 21, 2020
Applicant:

Honeywell International Inc., Charlotte, NC (US);

Inventors:

Neal Eldrich Solmeyer, Edina, MN (US);

Steven Tin, Edina, MN (US);

Matthew Wade Puckett, Phoenix, AZ (US);

Robert Compton, Loretto, MN (US);

Assignee:

Honeywell International Inc., Charlotte, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/26 (2006.01);
U.S. Cl.
CPC ...
G01R 33/26 (2013.01);
Abstract

Systems and embodiments for an integrated photonics tensor magnetometer are described herein. In certain embodiments, a system includes a plurality of magnetometers. The system also includes a laser carrier wafer coupled to each of the plurality of magnetometers that commonly distributes one or more lasers to each of the magnetometers in the plurality of magnetometers. Additionally, the system includes a plurality of photodetectors that detect light emitted from the laser carrier wafer and the plurality of magnetometers. Further, the system includes one or more processors that execute computer-executable instructions that cause the processor to monitor and control operation of the one or more lasers and calculate a magnetic field gradient based on the detected light from the magnetometers.


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