The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2022
Filed:
Jul. 11, 2018
Mayo Foundation for Medical Education and Research, Rochester, MN (US);
Jonathan L. Fasig, Rochester, MN (US);
Christopher K. White, Rochester, MN (US);
Chad M. Smutzer, Rochester, MN (US);
Michael J. Degerstrom, Rochester, MN (US);
Mayo Foundation for Medical Education and Research, Rochester, MN (US);
Abstract
A technique for non-invasively assessing current drawn by a device under test (DUT) by monitoring a supply voltage to the DUT. Frequency data for the DUT may be generated and used to form a current estimation model. First and second voltages are simultaneously measured using first and second test probes electrically connected to the DUT, while the first test probe is connected at a current source, and while the second test probe is connected at a DUT load that is configured to draw current from the current source. The current drawn by the DUT is then assessed by applying the current estimation model to the measured first and second voltages. In one case, the current drawn by the DUT is estimated without insertion of a circuit component into the DUT or extraction of a circuit conductor from the DUT.